Circuits Assembly - X-Tek Enhances Revolution X-Ray

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X-Tek Enhances Revolution X-Ray

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X-Tek Enhances Revolution X-Ray

Written by Mike Buetow
Wednesday, 05 March 2008
Revolution x-ray inspection system adds a Quad View facility and dual LCD monitors to enhance viewing capabilities and ease of use. Displays up to four images at once, and can separate x-ray images from the software control for reported clutter-free viewing. Samples can be safely placed within 250 µm of the focal spot, for up to 13000x magnification at all angles over the 400 x 400 mm manipulator scan area. X-Tek, www.xtekxray.com

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