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OptoTherm Upgrades EL Imaging System

Written by Mike Buetow

Tuesday, 18 March 2008

The EL thermal imaging system includes a new camera with a 320 x 240 uncooled detector array with <0.05˚C sensitivity and 16-bit digital camera link interface. Said to capture and display images at a rate of 30 frames/sec. and provide a resolution of 70 µm.

For use in locating shorts, stressed components and other defects, and analyzing thermal behavior of individual components. Model Board Comparison locates defects by comparing thermal behavior of defective boards to a known good board model.

OptoTherm, Inc., www.optotherm.com

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