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Matrix Metrologies Rolls Out XRF Tool for PCB WEEE/RoHS Apps |
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Written by Chelsey Drysdale
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Wednesday, 29 October 2008 |
Benchtop XRF tools for compliance testing and monitoring of prohibitive metals for RoHS/WEEE are said to provide nondestructive measurement of lead, mercury, chromium, bromine, and cadmium in almost any material. Permit lead content quantification for reverse RoHS applications, including military and aerospace demands requiring 2 to 5% minimum lead content. Measures standard circuit and packaging applications, including AuNiCu; immersion Au, Ag and Sn; matte Sn and SnPb on lead pads and bumps; and ENIG stacks. Spectrometers can be configured with gas-proportional, Si-PIN, or Silicon Drift-type detectors and primary beam filtration.
Matrix Metrologies, www.matrixmetrologies.com
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