Teradyne, Goepel Extend JTAG to Large-Scale ICT PDF Print E-mail
Written by Mike Buetow   
Wednesday, 11 December 2013 11:13

NORTH READING, MA -- Teradyne and Goepel Electronic have developed an extended boundary scan option for production in-circuit and functional PCB testers  and modular functional testers on VXI and PXI Express.

The integration of boundary scan platform software applies the tester’s native I/O instrumentation as JTAG hardware, the companies said, offering a unified test setup, higher test coverage and reuse of boundary scan procedures throughout the entire product lifecycle.

Goepel previously supported Teradyne's TestStation ICT. This latest extension covers modular large scale testers, said Alexander Beck, manager system integration in Goepel's JTAG/Boundary Scan division.

Goepel's System Cascon JTAG software accesses Teradyne's ATE high-speed channels, utilizing them as JTAG control signals for the UUT’s Test Access Port (TAP). Based on this chaining, boundary scan procedures can be directly taken over from earlier product life stages such as design validation or prototype test. The Teradyne test system controls the entire process, the companies said.

 

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