December 2014 Issue
FEATURES
RETROSPECTIVE
In Memoriam
A look back at friends and colleagues who left us in 2014.
COVER STORY
Root Cause Failure Analysis of Dendrite Shorting: A Comparison of Analytical Techniques
A study of 25 conformal-coated, no-clean assemblies after environmental testing for 40°C/90%RH for 168 hr. revealed FTIR, SEM/EDS and ion chromatography need an assist when determining the true source of contamination.
by Terry Munson
THE FACTORY
Cost Reductions Through Energy Transitions
Operational energy management is becoming increasingly important. How the SMT reflow oven has become ground zero for the energy reduction effort.
by Volker Feyerabend
FIRST PERSON
-
CAVEAT LECTOR
Giving it away.
Mike Buetow
MONEY MATTERS
-
ROI
The fab sandwich.
Peter Bigelow -
FOCUS ON BUSINESS
Cushioning the blows.
Susan Mucha
TECH TALK
- ON THE FOREFRONT
IoT: It’s all in the package.
E. Jan Vardaman - SCREEN PRINTING
Flat lined.
Clive Ashmore
- TECH TIPS
Minimizing BTC voiding.
Karl Seelig and Tim O’Neill - TEST AND INSPECTION
A career in the test trenches.
Jun Balangue - DEFECTS DATABASE
Breaking the slump.
Dr. Chris Hunt - GETTING LEAN
The waste behind SMT data gathering.
Michael Ford
