Agilent Unveils Production Test Solution for High-Speed Links
Published: 22 April 2004
by Atlanta, GA
Agilent Technologies Inc. (Palo Alto, CA) introduced a high-speed production-test solution for identifying the maximum number of product defects at the lowest cost. BIST Assist 6.4 is built on technology that enables signal integrity testing of high-speed serial links up to 6.4 Gb/s using a cost-effective loopback/built-in self-test (BIST) approach
To date, testing devices with high-speed links has forced a compromise. Traditional at-speed test approaches of automated test equipment (ATE) and bench instruments offer the highest fault coverage but at a price too high for volume manufacturing of cost-sensitive, consumer-driven devices. Loopback test offers low cost but does not provide adequate defect identification. According to Agilent, its technology has the fault coverage of traditional ATE at the low cost associated with loopback.
The device provides a solution for high-volume testing of high-speed interfaces such as PCI Express, Serial ATA, Fibre Channel and Serial RapidIO. These high-speed interfaces are becoming pervasive in current and future-generation convergence devices such as media PCs, disk drives, set top boxes and digital video recorders. The continuing trend toward miniaturization and higher functionality drives the need for faster system links on a device or on a circuit board.
The new technology provides at-speed level control and precision and adjustable jitter injection up to 430 ps, exercising high-speed link performance and expanding fault coverage. Because it is a calibrated solution within the test head, it is both a robust production and an efficient characterization solution. Each card provides four loops (16 differential pins) operating up to 6.4 Gb/s.
www.agilent.com
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