As attendance totals indicate, the first co-located IPC SMEMA Council's APEX/IPC Printed Circuits Expo/IPC Designers Summit exhibition and conference, held Feb. 24-26 in Anaheim, CA, proved to be a wise investment for the show's exhibitors. IPC (Northbrook, IL) announced today that the attendance increased 8% over last year, from a combined exhibition total of 5,300 in 2003 to 5,700 attendees this year. Additionally, the co-location increased traffic at both shows, with 60% of attendees indicating they would take part in the offerings of both the APEX and Expo events.

The three-day event attracted 10,200 total visitors (attendees and exhibitors) to the Anaheim Convention Center, which featured 480 companies covering more than 154,350 sq. ft. of exhibit space. The professional development courses welcomed nearly 1,300 participants and 1,100 people attended the technical conference. Also, this year's Interconnect Manufacturing Services (IMS) / Printed Circuit Board (PCB) Presidents Management and Electronics Manufacturing Services (EMS) Management Council meetings continued to draw strong numbers, with a total of 105 senior level managers in attendance.

Wendy Stallman, corporate communications manager at Electro Scientific Industries, concurred with McGuirk, "The quality of attendance at this year's event shows that the market is turning around. It is refreshing to see that people are beginning to make purchases again for existing equipment and that they are beginning to embrace new process technologies, such as embedded passives."

Attendee Mark Basich, manufacturing manager at Rauland Borg, siad, "The show was highly informative this year. It was well organized and having the shows at the same time allowed us to reduce the amount of time and energy we spent in previous years to meet and greet others in the industry."

Next year's co-located show will take place Feb. 22-24, 2005 in the same location.

IPC also recognized this year's best U.S. and international papers at its co-located exhibition and conference. Each winning paper received a $1,000 honorarium and a commemorative plaque from IPC.

"Tin Whisker Growth—Substrate Effect Understanding CTE Mismatch and IMC Formation" received the Best U.S. Paper award. Cookson Electronics' Dr. Yun Zhang, Chonglun Fan, Dr. Chen Xu, Oscar Khaselev and Dr. Joseph Abys co-authored the winning paper.

In addition, IPC recognized the following papers as Honorable Mentions: "Mechanical Bending Technique for Determining CSP Design and Assembly Weaknesses," by Mark R. Larsen and Dr. Ian R. Harvey from the University of Utah, David Turner of Inovar, Inc., Brent Porter of Bourns Electronics and James Ortowski from EDO Ceramics; and "Design of Experiment in Micro-Via Thermal Fatigue Test," by Dr. Tse Eric Wong, Harold S. Fenger and Dr. Isaac C. Chen of Raytheon Electronic Systems.

The Martin L. Barton Best International Paper Award, named for former APEX Technical Conference Director Martin Barton, was awarded to "Phosphorus in Electroless Nickel Layers—Curse or Blessing." The paper was authored by Atotech Deutschland GmbH's Sven Lamprecht and Hans Jurgen Schreier, as well as Kuldip Johal and Hugh Roberts of Atotech USA.

IPC recognized "The Effect of Thermal Loaded Bend Test on the Solder Joint Reliability," co-authored by Yuanze University Taiwan's Dr. Yeongshu Chen, C.S. Wang and C.H. Chen, as well as Solectron Corp.'s Dr. Aichyun Shiah, with an Honorable Mention for this international paper.

Copies of the winning papers are included in the 2004 Technical Conference Proceedings. They will also be published in the IPC's Review, a monthly publication distributed to IPC members.

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