Cleveland, OH, Oct. 13-  Linda Rae, senior VP and general manager of Keithley Instruments Inc., will keynote the 2^nd annual EOEM Design Online Expo this afternoon. Her presentation, "Best in Test: How World Class Organizations Rely on Testing To Make Better Products," will take place Oct. 13 from 2:30 to 3:00 p.m. in the Test & Measurement Technology Pavilion.

 

The presentation will discuss the test philosophies at some of the  most successful electronics manufacturers, as well as test strategies to improve manufacturing processes and overall product quality.

 

The EOEM Design Online Expo is an online conference and exhibition addressing critical technology areas impacting electronic design engineering. Running Oct. 13-14, it covers embedded technology, integrated circuits, packaging & interconnects, passive components, power, and test & measurement. For more information and to register online, visit www.reedbusinessinteractive.com/eoem/index.html.