Agilent Technologies Inc. (Palo Alto, CA) recently introduced its Versatest Series Model V5400. The system includes a dynamic algorithmic pattern generator (APG) and patented tester-per-site (TPS) architecture, which provide configuration flexibility and throughput improvement for wafer sort and final memory testing.

Compatible with the company's Versatest Series Model V4400, the Model V5400 overcomes the challenge of testing standard and stacked memory modules such as flash, DRAM and SRAM while offering up to 4,608 channels and 144 independent test sites. The increased performance and lower system costs helps reduce the overall cost of test for semiconductor contract manufacturers, fabless design houses and memory integrated device manufacturers.

The growing consumer demand for digital devices with added functionality and smaller footprints at lower prices has given rise to new test challenges. The devices require higher frequency test systems and the flexibility to test multiple types of memory such as flash and DRAM concurrently, while continuing to require a lower cost of test. Until now, memory manufacturers have purchased separate systems for testing the different kinds of memory embedded in handheld consumer devices. The system's single, scalable platform architecture will allow users to test standard memories, reduced pin-count devices, BIST-enabled devices and stacked memories at up to four times higher throughput compared to existing systems.

The TPS architecture allows each device under test (DUT) to receive its own set of tester resources. Dynamic APG can independently test up to four low-pin-count DUTs per site module. For complex tests or high pin count devices, dynamic APG can reallocate all site module resources toward testing a single DUT. Configurable solely through software, the dynamic APG enables the system to test a broad spectrum of devices without a change in tester hardware.

Complementing the flexibility of dynamic APG is the parallelism offered by the testhead. The system with 4608 I/O pins can asynchronously test up to 144 independent devices.

www.agilent.com/see/memorytest