CION Module/FXT114S JTAG/Boundary Scan module is controlled via a standard test access port. Provides 114 parallel I/O channels with IEEE-Std. 1149.1 compliant test resources. Can be integrated into test adapters. Provides 64 single-ended test channels. Channels independently controllable and I/O voltage can be programmed from 1.8V to 5.0V in groups of 32 channels. “Unstress” feature protects unit under test. Provides 50 differential (LVDS) channels. Said to be suitable for test of non-scannable circuit clusters, peripheral connectors, backplanes and AC-coupled networks.
Supported in the software platform System Cascon and can be used with ScanBooster and Scanflex boundary scan controller.
 
Goepel electronic, www.goepel.com