The VT-X series x-ray inspection system is said to shorten tact time for inline, post-solder inspection of PCBs. Is reportedly the first dual-mode x-ray inspection system that combines CT scanning with tomosynthesis scanning. Shortens inspection time for four BGAs to 60 sec., depending on specific board layout. Was designed to inspect ball grid arrays, QFP heel or back fillets, components with gullwing and J-shape leads, and connectors on board sizes up to 10 x 13". Can be used with Qup-Navi software.

Omron Electronics, www.omron247.com