Medalist i3070 Series 5 ICT system now offers analog measurement technology. Is said to be 20 to 30% faster than current model. Permits external circuits to be incorporated for added test coverage while providing better control of those circuits. Most existing i3070 and 3070 ICT programs will run on the new tester, and fixtures are also compatible. Addresses an array of in-circuit and functional test needs, including IEEE1149.6 boundary-scan standard testing and limited-access test applications for highly complex and small-footprint boards.

Agilent, www.agilent.com/find/i3070