Tabletop Shadow Moiré (TTSM) warpage metrology system measures warpage of substrates up to 300mm x 310mm (a 300mm wafer or two JEDEC trays).

Measurement reportedly takes fewer than two sec. Provides accurate measurement at room temp.

Akrometrix
www.akrometrix.com

Register now for PCB West the Silicon Valley's largest PCB industry trade show: pcbwest.com!

Submit to FacebookSubmit to Google PlusSubmit to TwitterSubmit to LinkedInPrint Article
Don't have an account yet? Register Now!

Sign in to your account