Bowman Debuts W Series XRF Instrument
W Series, for coating thickness analysis, uses poly-capillary optics to focus the x-ray beam to 7.5µm FWHM.
A 150X magnification camera measures features on that scale; it is accompanied by a secondary, low-magnification camera for live-viewing samples and birds-eye macro-view imaging. Dual-camera system shows entire part, zooms with high-mag camera, and pinpoints features to be programmed and measured. Programmable x-y stage (less than +/-1µm for each axis) selects and measures multiple points. Pattern recognition software and auto-focus features also do this automatically. 3D mapping capability displays topography of a coating on a part.
Bowman
Register now for PCB West, the largest trade show for the printed circuit and electronics industry in the Silicon Valley! Coming Sept. 11-13 to the Santa Clara Convention Center.
