DUT Scale Duo Interface for V93000 EXA Scale SoC test systems is for testing advanced semiconductors.

Usable space on DUT boards and probe cards is reportedly increased 50% or more; wafer probe and final test setups can accommodate component heights more than 3x taller. Can adapt to existing standard DUT board or probe card size or to switch to new larger size. Using sliding mechanism, users can switch back and forth between both formats to adapt to specific application requirements. Stiff extended bridge achieves deflection performance in direct probing setups. Supports applications including digital and RF device testing.

Advantest Corp.
advantest.com