Keysight Technologies' Electrical Structural Tester is a wire bond inspection solution for semiconductor manufacturing designed to ensure the integrity and reliability of electronic components.

Uses nano Vectorless Test Enhanced Performance technology to create a capacitive structure between the wire bond and a sensor plate, which enables the identification of subtle defects such as wire sag, near shorts, and stray wires to enable comprehensive assessment of wire bond integrity. Enables throughput of up to 72,000 units per hour through the ability to test up to 20 integrated circuits simultaneously, and is able to capture defects and enhance yield through advanced methods like marginal retry test (MaRT), dynamic part averaging test (DPAT), and real-time part averaging test (RPAT).

Keysight Technologies

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