BOSTON, MA – The Boston SMTA and IEEE Reliability chapters will be hosting a joint technical meeting on April 23 at Advanced MicroAnalytical in Salem, NH.

The feature technical presentation will be Multiscale Manufacturing-Inspection and Failure Analysis Methods for Electronics.

The meeting will cover laboratory techniques and test methods for a variety of samples from components to PCBA’s and whole commercial devices. A number of familiar analytical techniques will be discussed and demonstrated related to reliability and process inspection, including visual inspection and standard techniques like ball shear, x-ray imaging, CSAM and other standard composite methods. Additionally, more specialized approaches to failure analysis, research, and process development will be demonstrated including use of multiple types of electron microscopes, spectroscopy, and focused ion beam analysis for 3-D examination of devices on a nano-scale.

Speakers: Jared Kelly and Chuck Lemieux - Advanced MicroAnalytical and Hal Winslow – Symbotic

Date: April 23

Location: Advanced MicroAnalytical
50A Northwestern Drive Unit #4
Salem, New Hampshire 03079

To register for the in-person event, visit https://smta.org/events/EventDetails.aspx?id=1850297&group=225199