SwifTest 5.2, the latest version of the real-time statistical sampling software suite for semiconductor testing, claims to reduce test cost and improve quality and test efficiency.
 
Includes thee primary optional modules:
· SwifTest-Monitor captures test results in real-time from the tester and preprocesses the parametric data. With support for local, real-time alerts, it is a pre-requisite for Pintail’s sampling, outlier detection and TestScape database management system (DBMS).
· SwifTest-MX, a patented, real-time, statistical sampling tool, has proven to reduce test time by up to 40% in mixed-signal production at probe and final test.
· SwifTest-AQ outlier detection tool for reducing DPM by applying parts average testing in real-time; popular for automotive electronics at probe and final test.
 
New features include: Teradyne Flex ATE support; Part Average Testing (PAT) enhancements; Geographic Wafer Analysis option; SwifTest Commander; Device Profile Designer; Agilent Data Conduit; new triggers and alerts; and Lot Classification.
 
Pintail Technologies, pintail.com