News
Elektrobit to Exhibit the Display Tester at Nepcon China
Published: 20 March 2006
by Staff
Elektrobit Group will highlight the Display Tester in booth E1A04 during Nepcon China/EMT China in April. It provides automated testing on in-line or stand-alone test systems, and features software for the testing of small LCD displays, keyboards and housings of electronics equipment. The tester offers display defect detection through an immunity to significant variations in illumination, party orientation and display protection tape.
Features an Easy Test Case generation with GUI and does not require programming. It integrates easily through COM interface. It also supports a range of Firewire (IEEE-1394) and USB 2.0 cameras. Run-time version with calibration features is also available.
Features include unlimited maximum resolution, support for up to 254 cameras, test cases controllable with separate customer-specific applications and image processing in a computer with no extra hardware. No third-party low-level image processing libraries are needed.
Has tools for display location and alignment as well as for pixel defect and contrast identification. It performs the measurements for pattern matching, colour and greyscale illumination and keypad backlight. Inspects the icon presence and measures the keypad distance and size. The calibration tool uses pixel grid or checkerboard pattern method. Focus analysis tool extends usage to camera module testing.
Elektrobit, elektrobit.com
