K-Alpha materials characterization instrument uses x-ray photoelectron spectroscopy to quantitatively determine the surface chemical composition of the top few nanometers of solid materials. Insulators, semiconductors and metals can be analyzed in a user-friendly, reliable and automated way. An integral ion source provides a high-resolution depth profiling capability, thus facilitating true 3D analysis. For high-throughput sample analysis.

Thermo Electron Corp., thermo.com/surfaceanalysis