The USB-1149.1/4E is a USB 2.0-based boundary-scan test and in-system programming controller. Offers board testing and in-system programming of CPLDs, FPGAs, and flash memories at full theoretical programming speed. Delivers test vectors at a sustained test clock frequency of 100 MHz. Includes direct I2C and serial peripheral interface-based device programming capabilities. The SPI and I2C interfaces are independent of the JTAG test interface. Features automatic signal delay compensation for long cable runs to the UUT, slew rate control, adjustable input thresholds, software controllable signal pin reassignment, and eight analog channels for measuring target supply voltages or other signals up to +5VDC.
 
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