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The ScanBooster/USB-FXT is based on a USB2.0 interface. Provides solution for critical TAP accesses to ATE fixtures and HASS/HALT applications. JTAG/Boundary Scan Test, PLD programming and In-System programming can be executed over longer distances. Features two TAPs and supports programmable TCK frequency up to 16MHz max. Obtains flexibility and safety via distances up to 4 m to the Unit Under Test. Provides 32 programmable voltages, dynamic Parallel I/O, two ADC/DAC channels, external trigger signals and three static I/O. Can be used for extended test and PLD/Flash programming operations.

Goepel Electronic, www.goepel.com