The EKRA Enhanced Evaluation system is said to provide 100% inspection at line rate speeds. Features parallax-free optics and rectified imaging; permits a full shadow-free image of the substrate and automatic comparison of the print to the stencil CAD data. Scans and analyzes a PCB of 400 mm x 300 mm within 25 sec. at a resolution of 21 µm.

EKRA, www.ekra.com