EKRA Debuts Enhanced Evaluation Inspection
Published: 03 March 2009
The EKRA Enhanced Evaluation system is said to provide 100% inspection at line rate speeds. Features parallax-free optics and rectified imaging; permits a full shadow-free image of the substrate and automatic comparison of the print to the stencil CAD data. Scans and analyzes a PCB of 400 mm x 300 mm within 25 sec. at a resolution of 21 µm.
EKRA, www.ekra.com
Press Releases
- PARMI USA, INC. Appoints Juan Arango as Head of Sales and Business Development to Drive U.S. Market Growth
- Naprotek Welcomes Aerospace and Defense Veteran to Board of Directors
- Variosystems Highlights Focus on Full-System Solutions with New Brand Identity
- CE3S Appointed as East Coast Distributor for The Millice Group of Companies