Circuits Assembly Online Magazine

	CAVEAT LECTOR Change for the better. Mike Buetow		ROI Driven by data. Peter Bigelow
	On the Forefront Nepcon Japan: Embedded RF and 5G. E. Jan Vardaman		GETTING LEAN Mistake-proofing the line. Juan Jose Morales Ibarra and Filemon Sagrero Quirino
	TEST AND INSPECTION Voiding in QFPs. David Bernard, Ph.D.		TEST AND INSPECTION Can data be dumb? Robert Boguski
	DEFECTS DATABASE Post-rework underfill expansion. Bob Willis

March 2019