KOKOMO, IN – With cleaning on the up-tick due to more aggressive fluxes and greater concern over residues, a test method for localized extraction has been proposed to the IPC Ionic Conductivity/Ion Chromatography task group.
SAN JOSE – Dr. Luke P. Lee will describe a new 3-D optical lithography for waveguides self-assembly in the MEMS Packaging Symposium keynote next month.
In the presentation, Lee, a professor in the University of California Berkeley department of Bioengineering, will reveal the process, which uses self-aligned microlenses and self-writing in photopolymers.
His talk takes place May 22 in San Jose.
After the keynote, Karen Lightman, managing director, MEMS Industry Group, will present findings and recommendations from the MEMS Industry Group members’ annual meeting.
Symposium segments include consumer, automotive, biomedicine, and WLPs and 3-D ICs, among others.
RICHARDSON, TX – Test Research Inc. will integrate ASSET InterTech’s boundary scan technology into its line of in-circuit testers.
Under the terms of the extended agreement, ASSET will be the preferred supplier of boundary scan systems and related intellectual property to TRI and its customers. No financial terms were disclosed.