Milpitas, CA – CORWIL Technology is offering a free half-day seminar for a small audience to coincide with the opening of its new SIP/MCM Center. The company also recently announced a partnership agreement with Endicott Interconnect and Singulated.
The three companies will conduct the seminar on SIP (system-in-package) design and production on the morning of June 23 at the Ramada Inn in Sunnyvale, CA. Attendees will learn the benefits and demands of SIP products from Endicott Interconnect for substrates, Singulated for physical design and CORWIL for prototype and production assembly.
MINNEAPOLIS -- The SMTA International Opening Session and Annual Meeting will be held on Sept. 26 and 27, respectively, at the Donald Stephens Convention Center in Chicago, IL.
The Opening Session, free to all attendees, will include a discussion on “Solving RoHS Related Problems for Small to Medium Enterprises,” led by Jim Dills of The GoodBye Chain Group. It will also feature a presentation by Ken Gilleo of ET-Trends LLC on “What’s Next for Emerging Technologies?”
Feinfocus Tiger X-Ray inspection system with Automated Defect Recognition (ADR) features a faster, more precise sample manipulator with x-y speeds of 100 mm/s and accuracy to 200 μm, plus greater magnification capability. ADR greatly reduces analysis time on the production floor with fast, accurate recognition of solder voids and other abnormalities.
The 2-D x-ray inspection system offers a view into the third dimension via oblique viewing at virtually any desired angle using Auto Isocentric Motion (AIM) technology. The high-precision detector manipulator rotates 360° and tilts up to 70° to view complex assemblies at oblique angles. Offers an additional two-axis (x and y) manipulation of the sample and a third axis (z) manipulation of the x-ray tube, with normal positional accuracy down to 100 μm. Open tube x-ray technology allows for feature recognition below 1 μm.
Designed to meet the needs of computer, automotive, telecom, military/aerospace, medical device and information storage markets, it offers a geometric magnification of up to 727X (total magnification up to 2800X), True X-Ray Intensity (TXI) control for consistent image quality and a sample tray area of up to 24 x 24” (610 x 610 mm) to accommodate larger boards and multi-up flip chip assemblies.