Intermetallic growth and micro-voiding are issues for boards used in high-temp applications.
The pending J-STD-020D has updated guidelines for handling Pb-free parts, and no more “Tp.”
Press Releases
- Scanfil and Etteplan deepen their strategic partnership into production testing
- NOTE receives order worth 132 MSEK and expands collaboration with customer within Security & Defence
- Kitron Strengthens Order Backlog with EUR 11 Million Contract for Defense Communication
- ZTEST Electronics Inc. Announces Transition to the OTCID Market
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- Editorial Contributions
- Smarter SMT Starts at the Reel: How Splicing Kits are Powering Efficiency
- Verifying PCBA Cleanliness with Ion Chromatography
- Factors Contributing to Solder Ball Formation: A Guide
- Systematic Troubleshooting in Electronics Assembly: A Case Study in Solder Balling and Process Optimization