TestWay reference coverage analysis tool quantifies and qualifies test coverage for a range of inspection and test equipments. Features probe analyzer, an interactive, rules-based routine to identify possible probe locations based on copper surface. Coordinates access constraints, spacing checks, test points assignment, use of largest probe size, pin offset and bead probes, and company-specific guidelines. Estimates ICT and FPT test coverage based on measurement capabilities of the targeted test equipment. Generates accessibility report that states whether adequate probe locations were identified for each net. Defines the test line and combines ICT or FPT with complementary test techniques, such as AOI, AXI, BST, FPT, ICT, MDA and functional test.

Aster Technologies, www.aster-technologies.com

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