Differential contactors are customized for each semiconductor test application; contactor materials and probes are optimized for desired impedance. Configurations are derived from 3D electromagnetic simulation software and lab-correlated data; permit experimentation and optimization of the contactor properties. Increasing data rates of semiconductor devices require the test interface from the tester to the DUT be carefully designed to maintain signal integrity. Reduce signal amplitudes, increase speeds, reduce I/O counts and provide improved immunity to external noise; lead to size and power reductions for consumer products such as cellphones and laptops.

Multitest, www.multitest.com

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