Two PXI5396-DT/x JTAG digital I/O modules on PXI bus basis support structural JTAG/boundary scan tests and I/O operations up to 100MHz for functional test executions. Feature impedance-controlled VPC interface for direct coupling to signal-critical load boards or other verification environments. Can use one test hardware for both laboratory verification and in the production line with fixture-based systems. Are based on a two-component solution, consisting of a PXI-supported interface module and an offset desktop module. Separation of the modules can be up to 2m without loss of performance. Desktop module is equipped with front connector that permits the module to be connected directly to the test environment. Two variants are available that differ in the on-board memory depth of 72MB with the PXI 5396-DT and 144MB with the PXI 5396-DT/XM. Both variants provide 96 single-ended channels, configurable as input, output and tri-state. Signals are processed synchronously to the test bus operations in the JTAG mode. Dynamic I/O mode permits functional testing with programmable clock rates within the range of 500Hz to 100MHz. Include VarioCore technology.

Goepel electronic, www.goepel.com

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