ScanExpress boundary-scan tool suite v. 7.6 CD includes JTAG embedded test support for AMD Family 10 processors; enables processor emulation-based testing capabilities on AMD ASB2 (BGA), Opteron 4100, and Quad-Core Opteron CPUs. Integrates with National Instruments’ high-speed digital I/O (HSDIO) hardware. Supports 655x series of digital instruments with JTAG test clock (TCK) rates of up to 30 MHz. Other improvements include new test scripting functions and features, including direct JTAG scan functions, global script variables, and test time stamping; new pin direction constraints for TPG’s test vector generator; overhauled topology viewer, including a visual representation of all components on the scan chain, including series resistors, and test connectors; support for Blackhawk XDS560v2 series JTAG controllers, and JTAG embedded test support for Freescale i.MX51 and Texas Instruments’ AM/DM37x processors.

Corelis, www.corelis.com/education/JTAG_Boundary-Scan_Seminars_and_Training.htm

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