FX SL AOI inspection system reportedly has more than twice the inspection speed of previous generation systems. Magnification options include 8, 12, and 25 µm/pixel. Delivers automated inspection of solder and lead defects, component presence and position, correct part, polarity and through-hole parts. Is well suited for high-volume and high-mix manufacturing environments; is capable of inspecting 01005 components. Uses a standard package library.

Nordson YESTech, http://www.nordson.com/en-us/divisions/yestech/pages/default.aspx

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