Verios XHR scanning electron microscopy (SEM) provides sub-nanometer resolution and enhanced contrast. Advanced optics reportedly deliver impressive sensitivity to surface detail at low kV. Users may switch quickly between various operating conditions, maintain sample cleanliness, and obtain sub-nanometer resolution at any accelerating voltage from 1 kV to 30 kV. Optimized signal collection and advanced filtering abilities provide higher, more flexible contrast generation, and a greater range of samples to be investigated. Many beam-sensitive or non-conductive materials can now be accurately observed at the nanoscale, without preparation.

FEI, www.fei.com

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