Software release SI 7.46 reduces AOI inspection times through improved optimization of travel paths. Integrates Library Manager to assign new inspection patterns more quickly and easily, easing use of local and global inspection libraries. Can be used in parallel with library toolbox.

Integrates SPI Closed Loop (Downlink) so that currently measured displacement values of the SPI inspection can be returned to the paste printer as offset correction values.

Enables detailed appraisal of recognized defects in parallel with defect verification on S2088-II AOI, with live capture of defect image viewable under different camera perspectives — orthogonal and angled — and in color.

Viscom, viscom.de

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