DF2400 C-SAM acoustic microscope reportedly has 2x to 7x faster throughput than previous systems. Is automated and convertible to perform laboratory analysis. Can inspect ICs and flip chips in JEDEC-style trays or in metal carriers; inspects lead frame strips, IGBT power modules and other components. Throughput is reportedly doubled by incorporating two transducers and two simultaneous scanning stages. Two inertially balanced linear motor scanners reduce vibration and achieve scanning of ±0.5µm. Perform reflection-mode and Thru-Scan mode imaging. Uses non-immersion technology to minimize water exposure; can continuously control quality of water. Software makes acoustic images of up to 100 selected depths within a sample during a single scan. SECS-II/GEM E30 and SMEMA compatible.

Sonoscan, www.sonoscan.com

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