XT V 160 NF flat-panel-based x-ray inspection system facilitates real-time imaging and defect analysis of wafer-level, semiconductor device and PCBA applications. Comes with x-ray NanoFocus source and high-precision manipulator. Has 3MP flat-panel detector; provides feature recognition capability below 0.1µm. Features 360° continuous rotate detector axis; enables oblique angle views of up to 60° to the center of the detector panel. Offers intelligent region of interest lock. Tray is 580mm x 580mm.

Nikon Metrology, www.nikonmetrology.com

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