FailSim simulates defects to provide real-world test coverage on a live board. Identifies program, debug or fixture issues that could be reducing fault coverage. Verifies that an existing ICT test detects failures on an UUT by simulating component defects (wrong value) by using HW simulation, by placing additional resistors/capacitors in parallel/series to the DUT (device under test) while checking that the actual test statement detects the failure condition.

Digitaltest, www.digitaltest.net/page

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