SPEA, Goepel Integrate Boundary Scan into SPEA3030 ICT
Published: 03 September 2015
Boundary scan is now available in SPEA3030 multi-core in-circuit test. Boundary scan tests are now possible on all cores of the ICT (up to four). Can perform parallel work and simultaneous test sequences. Parallel test of several units under test can be handled.
SPEA, www.spea.com
Goepel electronics, www.goepel.com
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