planarCT module is for phoenix microme|x and nanome|x x-ray inspection systems to inspect solder joints and packages in printed circuit board assemblies. Non-destructive planar CT scan technology is for slice-based and volume inspection. Can adjust scan parameters, place the board on the inspection table, close the door and start the CT scan. High-precision manipulation table rotates region of interest in the x-ray beam; DXR detector captures 2D x-ray image series for slice reconstruction. Reconstructed slice or multislice view allows inspection results of a single plane or a whole package without overlaying structures from other board areas.

GE Measurement & Control, www.ge-mcs.com

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