Parallel Functional Test reportedly reduces panel testing to the time of a single board and reduces or eliminates end-of-line functional test steps. Combined with ICT and MultiWriter1 flash programming, is reportedly a one-stop, all-in-one parallel solution for high-volume small boards. Overall test time for an 8-up panel of control boards is reportedly 5x faster than traditional one-up testing. Board has ICT time of 3 sec., flash programming time of 15 sec., and functional testing of 20 sec. MultiWriter flash programming technology allows programming and verification of each of eight boards simultaneously.

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