Akrometrix Upgrades DIC Module
Published: 29 March 2016
AXP and PS200 systems for strain (CTE) measurements now come with optional Digital Image Correlation module. Dual camera provides x-y strain metrology throughout a thermal profile from room temp. up to 300°C. Has resolution approaching 100 microstrains.
Akrometrix, www.akrometrix.com
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