Akrometrix Introduces AXP 2.0 Shadow Moiré System
Published: 04 October 2016
AXP 2.0 shadow moiré system provides warpage metrology with lateral/top-bottom temperature uniformity. Has optional modules for DIC strain/CTE measurements and DFP for discontinuous surfaces. Uses top and bottom heaters with shadow moiré.
Akrometrix, www.akrometrix.com
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