Xcerra Updates MT2168 XT Semiconductor Test Handler
MT2168 XT pick-and-place handler has two new optional features that target optimization of test floor processes: double device detection (DDD) increases binning integrity; automatic temperature calibration helps calibrate as scheduled without manual processes.
DDD is based on a teachable feature that checks socket for emptiness before next package gets plunged. Optical distance check with laser is based on hardware additions; doesn’t require modification to socket. DDD is also applicable for ultra-thin packages. Automatic temperature calibration is based on optional measurement equipment and is controlled by handler software. During calibration process, no human interactions are required.
Xcerra
xcerra.com
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