FT160 XRF analyzer has three base configuration options for analysis of nanometer scale coatings.

Measures ultra-thin coatings on small features. Is a benchtop energy dispersive x-ray fluorescence analyzer with software and hardware created to deliver high sample throughput. Measures applications in the semiconductor, PCB and electronic components markets. Features high-end components to provide analysis of ultra-thin coatings on fine structures. Polycapillary optic focuses x-ray beam down to diameter of <20µm. A high-res silicon drift detector takes advantage of optic to measure nm-scale coatings on microelectronics and semiconductors. Has high-def camera with digital zoom.

Hitachi High-Tech Analytical Science
hitachi-hightech.com

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