Multi-reflection suppression-enabled 3-D MX3000 final vision inspection system is for memory modules.

Has two high-res MRS sensors; enables accurate, dual-sided final vision inspection. MRS technology identifies and rejects multiple reflections caused by shiny and reflective surfaces. Is used in SMT, semiconductor and other applications for inspection and metrology. Is automation-ready, provides inline defect review stations and auto sorts false calls into good trays after review. Includes inline module grippers. Auto-conversion supports memory module form factors.

CyberOptics
cyberoptics.com

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