Mycronic's DeepReview automatic defect classification system leverages AI to reduce false call rates will improving first-pass-yield in 3-D AOI.
Allows manufacturers to train neural network on their own inspection data, allowing them to apply, adapt and refine their own defect classification models according to in-house inspection standards – resulting in a reported 50-100% reduction in potential false calls for eligible components. Handles various defect sources such as solder joints, bridges, offsets and coplanarity, with plans to expand package library to cover most electronic components in the near future.
Mycronic