SANTA CLARA, CA -- Test Research Inc. will host a technology seminar here next month to introduce innovations to its PCBA testing and inspection equipment. The event takes place June 26 at Hotel Biltmore in Santa Clara.

The agenda will focus on new developments in 3D SPI and 3D AOI, and conclude with demonstrations on the company's novel 3D AXI systems, inline and desktop ICTs.

To register contact Fendi Lin at Fendi_Lin@tri.com.tw; 408-567-9898. For more information visittri.com.tw.

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