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ROME, NY -- The EOS/ESD Association today announced the release of its 2016 Technology Roadmap.

The trade group said the document provides estimates of future ESD thresholds of semiconductor devices and their potential impact on ESD control practices, with an emphasis on ICs and their handling.

The second major section contains information on trends in device testing and characterization from the ESDA and ESDA/JEDEC teams working on these methods and finishes up with a discussion on novel technology trends.

A free copy of the Roadmap is available here

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