BANNOCKBURN, IL – The producers of IPC Apex Expo have selected a paper by a Nokia researcher as the best technical paper of the upcoming conference.

“Reducing Dust Deposition on Electronic Equipment by Optimizing Cooling Air Flow Patterns” was written by Chen Xu and coauthor Jason Stafford of Imperial College London. The will present their work on Jan. 31.

Two papers were selected in the honorable mention category: “Head-on-Pillow Defect Detection – X-ray Inspection Limitations” by Lars Bruno and coauthor Benny Gustafson, Ericsson. This paper will be presented Jan. 29; “Analyzing a Printed Circuit Board with Oxide Residue Contamination” by Wade Goldman, Charles Stark Draper Laboratory and coauthored by Andrew Dineen, Hailey Jordan, Curtis Leonard of Draper Labs; and Edward Arthur, Raytheon Space and Airborne Systems. This paper will be presented on Jan. 30.

The winners are selected by the IPC Apex Expo Technical Program Committee. Authors will receive awards during the opening keynote on Jan. 29.

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